Application of byte error detecting codes to the design of self-checking circuits

Author

Pagey, Sandeep ; Al-Khalili, A.J.

Author_Institution

Dept. of Electr. & Comput. Eng., Concordia Univ., Montreal, Que., Canada

fYear

1994

fDate

15-17 Nov 1994

Firstpage

39

Lastpage

44

Abstract

In this paper, we discuss the application of byte error detecting codes to the design of self-checking circuits for the single stuck-at fault model. We discuss strongly fault-secure realization of a given Boolean function using byte error detecting codes. Even though parity is the most efficient separable code for the detection of single errors, we show that the use of a byte error detecting code can lead to lower cost of self-checking realization of a given function as compared to its self-checking realization using the parity code. We also present a method for the design of totally self-checking checkers for byte error detecting codes. Experimental results obtained for various test circuits are also discussed

Keywords

built-in self test; design for testability; error detection codes; fault location; logic design; logic testing; Boolean function; byte error detecting codes; fault-secure realization; parity code; self-checking checkers; separable code; stuck-at fault model; totally self-checking circuits; Application software; Boolean functions; Circuit faults; Circuit testing; Computer errors; Cost function; Design methodology; Electrical fault detection; Fault detection; Hardware;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 1994., Proceedings of the Third Asian

Conference_Location

Nara

Print_ISBN

0-8186-6690-0

Type

conf

DOI

10.1109/ATS.1994.367256

Filename

367256