Title :
Application of byte error detecting codes to the design of self-checking circuits
Author :
Pagey, Sandeep ; Al-Khalili, A.J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Concordia Univ., Montreal, Que., Canada
Abstract :
In this paper, we discuss the application of byte error detecting codes to the design of self-checking circuits for the single stuck-at fault model. We discuss strongly fault-secure realization of a given Boolean function using byte error detecting codes. Even though parity is the most efficient separable code for the detection of single errors, we show that the use of a byte error detecting code can lead to lower cost of self-checking realization of a given function as compared to its self-checking realization using the parity code. We also present a method for the design of totally self-checking checkers for byte error detecting codes. Experimental results obtained for various test circuits are also discussed
Keywords :
built-in self test; design for testability; error detection codes; fault location; logic design; logic testing; Boolean function; byte error detecting codes; fault-secure realization; parity code; self-checking checkers; separable code; stuck-at fault model; totally self-checking circuits; Application software; Boolean functions; Circuit faults; Circuit testing; Computer errors; Cost function; Design methodology; Electrical fault detection; Fault detection; Hardware;
Conference_Titel :
Test Symposium, 1994., Proceedings of the Third Asian
Conference_Location :
Nara
Print_ISBN :
0-8186-6690-0
DOI :
10.1109/ATS.1994.367256
