DocumentCode
2372034
Title
Assessing random dynamical network architectures for nanoelectronics
Author
Teuscher, Christof ; Gulbahce, Natali ; Rohlf, Thimo
Author_Institution
Comput., Comput. & Stat. Sci. Div., Los Alamos Nat. Lab., Los Alamos, NM
fYear
2008
fDate
12-13 June 2008
Firstpage
16
Lastpage
23
Abstract
Independent of the technology, it is generally expected that future nanoscale devices will be built from vast numbers of densely arranged devices that exhibit high failure rates. Other than that, there is little consensus on what type of technology and computing architecture holds most promises to go far beyond todaypsilas top-down engineered silicon devices. Cellular automata (CA) have been proposed in the past as a possible class of architectures to the von Neumann computing architecture, which is not generally well suited for future massively parallel and fine-grained nanoscale electronics. While the top-down engineered semiconducting technology favors regular and locally interconnected structures, future bottom-up self-assembled devices tend to have irregular structures because of the current lack of precise control over these processes. In this paper, we will assess random dynamical networks, namely random Boolean networks (RBNs) and random threshold networks (RTNs), as alternative computing architectures and models for future information processing devices. We will illustrate that - from a theoretical perspective - they offer superior properties over classical CA-based architectures, such as inherent robustness as the system scales up, more efficient information processing capabilities, and manufacturing benefits for bottom-up designed devices, which motivates this investigation. We will present recent results on the dynamic behavior and robustness of such random dynamical networks while also including manufacturing issues in the assessment.
Keywords
Boolean algebra; cellular automata; nanoelectronics; random processes; cellular automata; nanoelectronics; random Boolean networks; random dynamical network architectures; random threshold networks; von Neumann computing; Computer architecture; Concurrent computing; Information processing; Nanoelectronics; Nanoscale devices; Process control; Robustness; Self-assembly; Semiconductivity; Silicon devices;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanoscale Architectures, 2008. NANOARCH 2008. IEEE International Symposium on
Conference_Location
Anaheim, CA
Print_ISBN
978-1-4244-2552-5
Electronic_ISBN
978-1-4244-2553-2
Type
conf
DOI
10.1109/NANOARCH.2008.4585787
Filename
4585787
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