Title :
Delay fault propagation in synchronous sequential circuits
Author :
Cavallera, P. ; Girard, P. ; Landrault, C. ; Pravossoudovitch, S.
Author_Institution :
Lab. d´´Inf. de Robotique et de Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
Abstract :
The main task of the fault simulation process is to manage the propagation of the fault effects through the circuit. This paper addresses the problem of propagating gate delay faults in synchronous sequential circuits. The rules for propagating such gate delay faults without any restriction on their size and without considering explicitly the fault size, will be established in this paper. These propagation rules are the foundations of the fault simulator we are developing. This fault simulator will be suitable for simulating gate delay fault in synchronous sequential circuits whatever the fault size may be
Keywords :
delays; digital simulation; fault diagnosis; logic testing; sequential circuits; circuit model; delay fault propagation; fault effects; fault simulation; gate delay faults; logic testing; synchronous sequential circuits; Circuit faults; Circuit simulation; Circuit testing; Clocks; Delay effects; Electrical fault detection; Fault detection; Logic circuits; Propagation delay; Sequential circuits;
Conference_Titel :
Test Symposium, 1994., Proceedings of the Third Asian
Conference_Location :
Nara
Print_ISBN :
0-8186-6690-0
DOI :
10.1109/ATS.1994.367259