Title :
Proceedings of IEEE 3rd Asian Test Symposium (ATS)
Abstract :
The following topics were dealt with: fault simulation; online testing; test pattern generation and parallel testing; diagnostics; supply current testing; design for testability; fault modelling; software testing; built-in self-test; verification; synthesis for testability; test cost reduction; fault tolerant systems; analogue testing; and adaptive testing
Keywords :
adaptive systems; automatic testing; built-in self test; circuit testing; design for testability; economics; electronic equipment testing; fault diagnosis; fault tolerant computing; parallel processing; program diagnostics; program testing; adaptive testing; analogue testing; built-in self-test; design for testability; diagnostics; fault modelling; fault simulation; fault tolerant systems; online testing; parallel testing; software testing; supply current testing; synthesis for testability; test cost reduction; test pattern generation; verification;
Conference_Titel :
Test Symposium, 1994., Proceedings of the Third Asian
Conference_Location :
Nara, Japan
Print_ISBN :
0-8186-6690-0
DOI :
10.1109/ATS.1994.367263
