Title :
A 3/spl mu/V offset operational amplifier with 20nV//spl radic/Hz input noise PSD at DC employing both chopping and autozeroing
Author_Institution :
Analog Devices, Inc.
Keywords :
Artificial intelligence; Circuit noise; Circuit testing; Frequency; Low-noise amplifiers; Noise measurement; Noise reduction; Operational amplifiers; Phase measurement; Phase noise;
Conference_Titel :
Solid-State Circuits Conference, 2002. Digest of Technical Papers. ISSCC. 2002 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-7335-9
DOI :
10.1109/ISSCC.2002.992270