Title :
The development of the precise standard cell that can be upset down
Author_Institution :
Nat. Inst. of Metrol., Beijing, China
Abstract :
It has been proved that most of the standard cells, which are made with special technology and are able to be upset, have the annual variations less than 0.6 /spl mu/V through long-term survey, transportation, upset and all kinds of performance tests. It can rapidly restore the original value after upset down and is suitable to be the transfer voltage standard for the comparison of two different Josephson voltage standards.
Keywords :
Josephson effect; measurement errors; measurement standards; performance evaluation; voltage measurement; 0.6 muV; China; Germany; Josephson voltage standards; PTB; annual variations; precise standard cell; transfer voltage standard; Electrical resistance measurement; Manufacturing; Measurement standards; Metrology; Petroleum; Stability; Standards development; Temperature; Testing; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1996 Conference on
Conference_Location :
Braunschweig, Germany
Print_ISBN :
0-7803-3376-4
DOI :
10.1109/CPEM.1996.546539
