DocumentCode
2372703
Title
The development of the precise standard cell that can be upset down
Author
Hu Yan Rui
Author_Institution
Nat. Inst. of Metrol., Beijing, China
fYear
1996
fDate
17-21 June 1996
Firstpage
25
Lastpage
26
Abstract
It has been proved that most of the standard cells, which are made with special technology and are able to be upset, have the annual variations less than 0.6 /spl mu/V through long-term survey, transportation, upset and all kinds of performance tests. It can rapidly restore the original value after upset down and is suitable to be the transfer voltage standard for the comparison of two different Josephson voltage standards.
Keywords
Josephson effect; measurement errors; measurement standards; performance evaluation; voltage measurement; 0.6 muV; China; Germany; Josephson voltage standards; PTB; annual variations; precise standard cell; transfer voltage standard; Electrical resistance measurement; Manufacturing; Measurement standards; Metrology; Petroleum; Stability; Standards development; Temperature; Testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 1996 Conference on
Conference_Location
Braunschweig, Germany
Print_ISBN
0-7803-3376-4
Type
conf
DOI
10.1109/CPEM.1996.546539
Filename
546539
Link To Document