Title :
Low-voltage design for portable systems - when MOSFET switches become MOSFET dimmers
Author_Institution :
Texas Instruments
Keywords :
Degradation; Doping; Fluctuations; Instruments; Leakage current; Low voltage; MOSFET circuits; Physics; Switches; Technological innovation;
Conference_Titel :
Solid-State Circuits Conference, 2002. Digest of Technical Papers. ISSCC. 2002 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-7335-9
DOI :
10.1109/ISSCC.2002.992300
