Millimeter Wave Devices Based on a 3-D Electromagnetic Band Gap Crystal Manufactured by Layer-By-Layer Ceramic Stereolithography

Author

Delhote, Nicolas ; Baillargeat, Dominique ; Verdeyme, Serge ; Delage, Cyrille ; Chaput, Christophe

Author_Institution

Xlim Res. Inst., Limoges

fYear

2008

fDate

27-31 Oct. 2008

Firstpage

551

Lastpage

554

Abstract

A 3D Electromagnetic band gap layer-by-layer crystal is studied in the millimeter wave domain. It has been designed and manufactured by 3D ceramic stereolithography with the ceramic material called zircon. Its particular properties have been used to design a high unloaded quality factor cavity (structural defect) localized within this crystal. This cavity has been measured at 30.5 GHz to demonstrate the concept in the millimeter wave domain. This resonant defect has also theoretically been studied while considering a low loss ceramic material such as BZT. It shows that an unloaded Q close to 10 000 can be obtained at this frequency.

Keywords

Q-factor; ceramics; millimetre wave devices; photonic band gap; stereolithography; 3D ceramic stereolithography; 3D electromagnetic band gap layer-by-layer crystal; high unloaded quality factor cavity; low loss ceramic material; millimeter wave devices; millimeter wave domain; resonant defect; zircon; Ceramics; Crystalline materials; Manufacturing; Millimeter wave devices; Millimeter wave measurements; Periodic structures; Photonic band gap; Q factor; Resonance; Stereolithography;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Conference, 2008. EuMC 2008. 38th European

Conference_Location

Amsterdam

Print_ISBN

978-2-87487-006-4

Type

conf

DOI

10.1109/EUMC.2008.4751511

Filename

4751511