DocumentCode
2373126
Title
X-ray photoelectron spectroscopy of complex oxides and chemical bonding
Author
Atuchin, Victor V.
Author_Institution
Lab. of Opt. Mater. & Struct., SB RAS, Novosibirsk
fYear
2008
fDate
1-5 July 2008
Firstpage
6
Lastpage
7
Abstract
X-ray photoelectron spectroscopy is considered as a tool for investigation of complex oxide dielectrics. Analytical methods nonsensitive to top surface charging effects are proposed. Relationship is considered between core shell electronic parameters of such metals as Nb, Ti, P, Sr and U chemical oxide bond lengths in complex oxides.
Keywords
X-ray photoelectron spectra; binding energy; bonds (chemical); chemical shift; X-ray photoelectron spectroscopy; chemical bonding; chemical oxide bond lengths; chemical shift; complex oxide dielectrics; core shell electronic parameters; photoelectron binding energy; surface charging effects; Bonding; Chemical analysis; Chemical elements; Dielectrics; Electrochemical impedance spectroscopy; Lattices; Niobium compounds; Optical materials; Strontium; Surface charging; Photoelectron binding energy; chemical shift; oxide bond length;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices and Materials, 2008. EDM 2008. 9th International Workshop and Tutorials on
Conference_Location
Novosibirsk
ISSN
1815-3712
Print_ISBN
978-5-7782-0893-3
Type
conf
DOI
10.1109/SIBEDM.2008.4585845
Filename
4585845
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