Title :
X-ray photoelectron spectroscopy of complex oxides and chemical bonding
Author :
Atuchin, Victor V.
Author_Institution :
Lab. of Opt. Mater. & Struct., SB RAS, Novosibirsk
Abstract :
X-ray photoelectron spectroscopy is considered as a tool for investigation of complex oxide dielectrics. Analytical methods nonsensitive to top surface charging effects are proposed. Relationship is considered between core shell electronic parameters of such metals as Nb, Ti, P, Sr and U chemical oxide bond lengths in complex oxides.
Keywords :
X-ray photoelectron spectra; binding energy; bonds (chemical); chemical shift; X-ray photoelectron spectroscopy; chemical bonding; chemical oxide bond lengths; chemical shift; complex oxide dielectrics; core shell electronic parameters; photoelectron binding energy; surface charging effects; Bonding; Chemical analysis; Chemical elements; Dielectrics; Electrochemical impedance spectroscopy; Lattices; Niobium compounds; Optical materials; Strontium; Surface charging; Photoelectron binding energy; chemical shift; oxide bond length;
Conference_Titel :
Electron Devices and Materials, 2008. EDM 2008. 9th International Workshop and Tutorials on
Conference_Location :
Novosibirsk
Print_ISBN :
978-5-7782-0893-3
DOI :
10.1109/SIBEDM.2008.4585845
