DocumentCode
2373484
Title
Measured vs. volume model-predicted flicker-of-frequency instability in VHF quartz crystal resonators
Author
Driscoll, M.M. ; Hanson, W.P.
Author_Institution
Westinghouse Electron. Syst. Group, Baltimore, MD, USA
fYear
1993
fDate
2-4 Jun 1993
Firstpage
186
Lastpage
192
Abstract
Both passive, in-bridge and in-oscillator measurements for AT, SC, and BT-cut, overtone-mode resonators operating at 40, 80, 100, and 160 MHz have been performed. Measurements were made using four-crystal oscillators as low-noise reference signal generators. The data indicate poor agreement between measured and mode-predicted resonator stability, especially for fifth-overtone AT and SC-cut resonators operating at 40 and 160 MHz. Measured data were also compared to predictions using an alternative model proposed by T. Parker (1985). Using the Parker model, relatively poor agreement was found for the case of BT-cut resonators. The data suggest that further refinement of resonator short-term stability models is necessary
Keywords
crystal resonators; flicker noise; frequency stability; 40 to 160 MHz; AT-cut resonator; BT-cut resonators; Parker model; SC-cut resonators; SiO2; VHF quartz crystal resonators; flicker-of-frequency instability; four-crystal oscillators; in-bridge measurement; in-oscillator measurements; low-noise reference signal generators; mode-predicted resonator stability; overtone-mode resonators; passive measurement; resonator short-term stability models; 1f noise; Acoustic noise; Frequency control; Noise level; Noise measurement; Oscillators; Phase noise; Pollution measurement; Resonant frequency; Volume measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control Symposium, 1993. 47th., Proceedings of the 1993 IEEE International
Conference_Location
Salt Lake City, UT
Print_ISBN
0-7803-0905-7
Type
conf
DOI
10.1109/FREQ.1993.367395
Filename
367395
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