DocumentCode :
2373492
Title :
Light absorption and resonant levels in p-Si
Author :
Yen, S.T. ; Tulupenko, V. ; Cheng, E.S. ; Feng, Y.H. ; Lee, C.P. ; Ryzhkov, V. ; Dalakyan, A.
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu
Volume :
2
fYear :
2003
fDate :
16-20 Sept. 2003
Abstract :
In this work we made an attempt of a direct experimental study of the hole capture by the resonant impurity level(s) in the strong enough electric field in p-Si. The idea was to investigate the modulation of the light absorption for boron-doped Si under the applied electric field. The change in the absorption for optical transitions between impurity states in the energy gap and between ground and resonant impurity levels was studied by using possibilities of a time-resolved spectroscopy. Analysis of experimental results allowed us to make a conclusion about capture of holes by the resonant levels in p-Si under the electric field
Keywords :
boron; electric fields; elemental semiconductors; energy gap; light absorption; silicon; time resolved spectroscopy; Si:Br; applied electric field; boron-doped Si; energy gap; light absorption; optical transition; p-Si; resonant impurity level; resonant level; time-resolved spectroscopy; Absorption; Charge carriers; Mechanical engineering; Optical modulation; Physics; Resonance; Semiconductor impurities; Semiconductor nanostructures; Spectroscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Optoelectronics and Lasers, 2003. Proceedings of CAOL 2003. First International Conference on
Conference_Location :
Alushta, Crimea
Print_ISBN :
0-7803-7948-9
Type :
conf
DOI :
10.1109/CAOL.2003.1251253
Filename :
1251253
Link To Document :
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