• DocumentCode
    2373663
  • Title

    Pb-free plating for peripheral/leadframe packages

  • Author

    Nakadaira, Yoshikuni ; Matsuura, Tatsuo ; Tsuriya, Masahiro ; Nhat, D.V. ; Kangas, Ryan ; Conrad, Jason ; Sundram, Balachandar ; Lee, Kee-Huat ; Arunasalam, Selvakumar M.

  • Author_Institution
    Motorola Japan Ltd, Tokyo, Japan
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    213
  • Lastpage
    218
  • Abstract
    Leadframe packages utilize SnPb plating on terminals to protect the base metal from corrosion and to provide a solderable surface. However, customers are moving to environmentally conscious products establishing a need to develop alternative Pb free plating finishes for terminals. The most promising solution is Sn-based electroplating. Several Sn-based plating chemistries are commercially available at comparable costs to SnPb. However, Sn-based plating finishes are not free of issues. Whisker growth can cause a component to electrically short. In addition, there is little data on solderability and solder joint reliability for Pb free terminal finishes with Pb free solders, as well as, SnPb solders. Sn, SnCu, SnBi, and SnAg plating finishes were evaluated for whisker growth, solderability, and solder joint reliability. For the packages SnBi out-performed the other Sn-based finishes in terms of whisker free life, needle length, and quantity. Solderability for the Pb free finishes was poor in comparison to the SnPb finish, which passed all solderability preconditioning and test methods. Lastly, solder joint reliability appears to be comparable for all Pb free finishes to the SnPb finish
  • Keywords
    electroplating; environmental factors; packaging; production testing; soldering; whiskers (crystal); Sn; Sn-based plating finishes; SnAg; SnBi; SnCu; environmentally conscious products; leadframe packages; needle length; preconditioning; solder joint reliability; solderability; solderable surface; test methods; whisker growth; Chemistry; Corrosion; Costs; Lead; Needles; Packaging; Protection; Soldering; Testing; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Environmentally Conscious Design and Inverse Manufacturing, 2001. Proceedings EcoDesign 2001: Second International Symposium on
  • Conference_Location
    Tokyo
  • Print_ISBN
    0-7695-1266-6
  • Type

    conf

  • DOI
    10.1109/.2001.992348
  • Filename
    992348