Power plane resonances as a source of delta-I noise and the influence of decoupling capacitors

Author

Van Den Berghe, S. ; Olyslager, F. ; De Zutter, D. ; De Moerloose, J. ; Temmerman, W.

Author_Institution

Dept. of Inf. Technol., Ghent Univ., Belgium

fYear

1997

fDate

18-22 Aug 1997

Firstpage

145

Lastpage

148

Abstract

This contribution presents a study of the influence of power planes resonances on the delta-I noise. Noise generated at one point in a system can be transported to a distant point. This phenomenon is studied using the FDTD-technique and a transfer impedance is introduced to quantify the results. To shield sensitive ICs, capacitive decoupling can be used. The influence of such capacitive shielding is discussed. Analytical approximations are given together with more details on the influence of the different parameters

Keywords

electric impedance; finite difference time-domain analysis; integrated circuit noise; integrated circuits; shielding; FDTD-technique; IC shielding; capacitive decoupling; capacitive shielding; decoupling capacitors; delta-I noise; power plane resonance; transfer impedance; Capacitors; Electromagnetic transients; Electromagnetic waveguides; Inductance; Information technology; Integrated circuit noise; Resonance; Switches; Telecommunications; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 1997. IEEE 1997 International Symposium on

Conference_Location

Austin, TX

Print_ISBN

0-7803-4140-6

Type

conf

DOI

10.1109/ISEMC.1997.667558

Filename

667558