Title :
Power plane resonances as a source of delta-I noise and the influence of decoupling capacitors
Author :
Van Den Berghe, S. ; Olyslager, F. ; De Zutter, D. ; De Moerloose, J. ; Temmerman, W.
Author_Institution :
Dept. of Inf. Technol., Ghent Univ., Belgium
Abstract :
This contribution presents a study of the influence of power planes resonances on the delta-I noise. Noise generated at one point in a system can be transported to a distant point. This phenomenon is studied using the FDTD-technique and a transfer impedance is introduced to quantify the results. To shield sensitive ICs, capacitive decoupling can be used. The influence of such capacitive shielding is discussed. Analytical approximations are given together with more details on the influence of the different parameters
Keywords :
electric impedance; finite difference time-domain analysis; integrated circuit noise; integrated circuits; shielding; FDTD-technique; IC shielding; capacitive decoupling; capacitive shielding; decoupling capacitors; delta-I noise; power plane resonance; transfer impedance; Capacitors; Electromagnetic transients; Electromagnetic waveguides; Inductance; Information technology; Integrated circuit noise; Resonance; Switches; Telecommunications; Voltage;
Conference_Titel :
Electromagnetic Compatibility, 1997. IEEE 1997 International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-4140-6
DOI :
10.1109/ISEMC.1997.667558
