DocumentCode :
2373850
Title :
Investigations of AM and PM noise in X-band devices
Author :
Ascarrunz, F.G. ; Ferre, E.S. ; Walls, F.L.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fYear :
1993
fDate :
2-4 Jun 1993
Firstpage :
303
Lastpage :
311
Abstract :
The authors report on measurements of phase modulation (PM) and amplitude modulation (AM) noise in a variety of amplifiers, dielectric resonator oscillator (DRO) sources, and mixers at 10.6 GHz. Two-channel measurement systems and cross-correlation analysis were used. In amplifiers there are at least two random noise processes that generate equal levels of PM and AM noise when the amplifier is in the linear operating range. The noise processes correspond to a flicker noise process and a white noise process. In the DRO sources these noise mechanisms are shown to be present in the active components and determine the AM and PM characteristics of the oscillator. A noise model for oscillators incorporating Leeson´s PM noise model and a model for AM noise in which the active components have two common random noise processes are proposed. The authors report AM noise levels of 140 dB below the PM levels at 1 Hz and typical noise floors of -169 dBc/Hz at 10 MHz. Noise residuals in mixers from three different companies are reported. Typical 1 Hz intercepts vary from -110 to -127 dBc/Hz. Noise floors are typically ~-173 dBc/Hz
Keywords :
amplitude modulation; circuit noise; dielectric resonator oscillators; flicker noise; microwave amplifiers; microwave mixers; microwave oscillators; phase modulation; phase noise; thermal noise; white noise; 10 to 11 GHz; 10.6 GHz; AM noise; DRO sources; FET amplifier; GaAs amplifier; Leeson´s PM noise model; X-band devices; cross-correlation analysis; dielectric resonator oscillator; flicker noise process; mixers; noise floors; noise model; random noise processes; two-channel measurement system; white noise process; 1f noise; Active noise reduction; Amplitude modulation; Dielectric measurements; Noise generators; Noise level; Noise measurement; Oscillators; Phase measurement; Phase modulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium, 1993. 47th., Proceedings of the 1993 IEEE International
Conference_Location :
Salt Lake City, UT
Print_ISBN :
0-7803-0905-7
Type :
conf
DOI :
10.1109/FREQ.1993.367410
Filename :
367410
Link To Document :
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