Title :
Can the current behavior of faulty and fault-free ICs and the impact on diagnosis
Author :
Thibeault, C. ; Boisvert, L.
Author_Institution :
Dept. of Electr. Eng., Ecole de Technol. Superieure, Montreal, Que., Canada
Abstract :
The purpose of this paper is to analyze the current behavior of faulty and fault free integrated circuits (ICs) and its impact on diagnosis. More specifically, we first show that normal sub-threshold current can be modeled by a Gaussian distribution. Then, we investigate faulty IC current variations caused to the load connected to nodes involved in bridging faults. Finally, we propose some modifications to a diagnosis method based on maximum likelihood estimation to deal with these behaviors
Keywords :
CMOS integrated circuits; Gaussian distribution; VLSI; fault diagnosis; integrated circuit testing; maximum likelihood estimation; CMOS; Gaussian distribution; bridging faults; current behavior; fault diagnosis; fault-free ICs; faulty; maximum likelihood estimation; sub-threshold current; Circuit faults; Circuit testing; Fault diagnosis; Gaussian distribution; Histograms; Integrated circuit modeling; Integrated circuit testing; Maximum likelihood estimation; Robustness; Subthreshold current;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1998. Proceedings., 1998 IEEE International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
0-8186-8832-7
DOI :
10.1109/DFTVS.1998.732167
