• DocumentCode
    2374135
  • Title

    Stereo Vision Calibration Procedure for 3D Surface measurements

  • Author

    Vilaca, Joao L. ; Fonseca, Jaime ; Pinho, A.C.

  • Author_Institution
    Dept. of Ind. Electron., Minho Univ.
  • fYear
    2006
  • fDate
    6-10 Nov. 2006
  • Firstpage
    3508
  • Lastpage
    3513
  • Abstract
    In reverse engineering, rapid prototyping or quality control with complex 3D object surfaces, there is often the need to scan a complete 3D model using laser digitizers. Those systems usually use one camera and one laser,- using triangulation techniques; complex 3D objects can cause information gaps in the model obtained. To overcome this problem, another camera can be used. Traditional calibration procedures for those systems normally result in a full 3D camera calibration, involving individual implicit camera parameters, a rigid motion equation relating the explicit cameras parameters of each camera and the intersection with the laser line. This paper presents a new stereo vision laser strip calibration procedure for 3D surface measurements. In this calibration procedure the laser plane is the one that matters, only one set of laser-coplanar calibration points for camera calibration is needed, and a dead zone scan area is considered, since the digitalization arm is mounted in a 3 degree freedom machine PC-based motion control with multiple scan paths
  • Keywords
    calibration; cameras; laser beam applications; stereo image processing; 3D camera calibration; 3D surface measurements; PC-based motion control; laser digitizers; laser-coplanar calibration points; quality control; rapid prototyping; stereo vision calibration procedure; stereo vision laser strip calibration; triangulation techniques; Calibration; Cameras; Equations; Laser modes; Prototypes; Quality control; Reverse engineering; Stereo vision; Strips; Surface emitting lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IEEE Industrial Electronics, IECON 2006 - 32nd Annual Conference on
  • Conference_Location
    Paris
  • ISSN
    1553-572X
  • Print_ISBN
    1-4244-0390-1
  • Type

    conf

  • DOI
    10.1109/IECON.2006.347777
  • Filename
    4153506