Title :
Specification-driven test design for analog circuits
Author :
Variyam, Pramodchandran N. ; Chatterjee, Abhijit
Author_Institution :
Sch. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
In this paper we present a test generation approach for time and frequency domain testing of analog circuits. Tests are generated to detect faulty circuits which violate one or more circuit specifications without explicitly performing exhaustive specification based tests. We formulate the test stimulus generation problem as a search problem in which the primary goal is to reduce the probability of classifying a bad circuit as good and vice versa. Genetic algorithms are used to search for the optimum transient and steady state tests
Keywords :
analogue integrated circuits; fault diagnosis; frequency-domain analysis; genetic algorithms; integrated circuit testing; production testing; time-domain analysis; transient analysis; circuit specifications; faulty circuits; frequency domain testing; genetic algorithms; probability; search problem; specification-driven test design; steady state tests; test generation approach; test stimulus generation problem; time domain testing; transient tests; Analog circuits; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Frequency domain analysis; Genetic algorithms; Performance evaluation; Search problems; Steady-state;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1998. Proceedings., 1998 IEEE International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
0-8186-8832-7
DOI :
10.1109/DFTVS.1998.732183
