مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2374244

Title :

Author index

fYear :

1998

fDate :

4-4 Nov. 1998

Firstpage :

355

Lastpage :

355

Abstract :

The author index contains an entry for each author and coauthor included in the proceedings record.

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Defect and Fault Tolerance in VLSI Systems, 1998. Proceedings., 1998 IEEE International Symposium on

Conference_Location :

Austin, TX, USA

ISSN :

1550-5774

Print_ISBN :

0-8186-8832-7

Type :

conf

DOI :

10.1109/DFTVS.1998.732186

Filename :

732186

Link To Document :