DocumentCode :
2374311
Title :
Effect of stress on guided EM waves in anisotropic dielectric plates
Author :
Lee, P.C.Y. ; Yu, J.D. ; Ballato, A.
Author_Institution :
Dept. of Civil Eng. & Oper. Res., Princeton Univ., NJ, USA
fYear :
1993
fDate :
2-4 Jun 1993
Firstpage :
461
Lastpage :
471
Abstract :
The changes in the frequencies or velocities of guided EM (electromagnetic) waves in infinite and anisotropic dielectric plates affected by uniform and thickness-dependent stress fields are studied. For the uniformly applied stresses, frequency changes as a function of wavenumber are computed based on exact solutions of the 3-D Maxwell equations. For the thickness-dependent stress fields, such as those caused by the steady accelerations in plates attached to a rigid base, frequency changes are computed based on the variational techniques and the Rayleigh-Ritz method. For numerical computations, a dielectric plate of lithium niobate with thickness 2b = 3.27 mm is considered. It is found that the maximum frequency shift is about (1 ~ 2) × 10-5 for the uniformly applied stress of 1MPa. For steady acceleration on plates attached to a rigid base, the maximum frequency shift is about (3 ~ 15) × 10-10/g for 2b = 3.27 mm
Keywords :
Maxwell equations; Rayleigh-Ritz methods; dielectric waveguides; frequency stability; stress effects; variational techniques; waveguide theory; 3.27 mm; 3D Maxwell equations; LiNbO3; Rayleigh-Ritz method; anisotropic dielectric plates; elastic dielectric waveguide; electromagnetic wave velocity; guided EM waves; infinite dielectric plate; maximum frequency shift; numerical computations,; steady accelerations; stress effect; thickness-dependent stress fields; variational techniques; wavenumber; Acceleration; Anisotropic magnetoresistance; Capacitive sensors; Dielectrics; Frequency; Maxwell equations; Nonlinear equations; Piezoelectric effect; Piezooptic effects; Tensile stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium, 1993. 47th., Proceedings of the 1993 IEEE International
Conference_Location :
Salt Lake City, UT
Print_ISBN :
0-7803-0905-7
Type :
conf
DOI :
10.1109/FREQ.1993.367433
Filename :
367433
Link To Document :
بازگشت