DocumentCode
2374388
Title
Self-sustained acoustoelectric and photoelectric oscillations in systems with relaxation
Author
Vyun, Vladimir A.
Author_Institution
Inst. of Semicond. Phys., Acad. of Sci., Novosibirsk, Russia
fYear
1993
fDate
2-4 Jun 1993
Firstpage
509
Lastpage
513
Abstract
New acoustoelectric and photoelectric self-sustained oscillation and self-modulation phenomena in systems with relaxation have been investigated. Layered metal-semiconductor-dielectric or piezoelectric structures with external feedback have been studied theoretically and experimentally. The theory presented explains the experimental results and gives a criterion for existence of the phenomena. A quasi-harmonic regime of the self-sustained oscillations is described by the Van-der-Pol equation, which can be very useful for practical applications because it expresses the relaxation properties of the structure in terms of the oscillation frequency. Possible applications of the self-sustained oscillations to new physical and chemical sensors and methods for investigating semiconductors are suggested. Dynamic characteristics of the self-sustained oscillations under different external conditions of as temperature and illumination are discussed
Keywords
acoustoelectric devices; acoustoelectric effects; lithium compounds; photoelectricity; piezoelectric oscillations; piezoelectric thin films; relaxation oscillators; silicon; surface acoustic waves; LiNbO3-Si; SAW; Van-der-Pol equation; chemical sensors; dynamic characteristics; external feedback; illumination; layered metal-semiconductor-dielectric structure; metal-piezoelectric-semiconductor structure; oscillation frequency; photoelectric self-sustained oscillation; physical sensor; relaxation properties; self-modulation phenomena; self-sustained acoustoelectric oscillation; Electrons; Equations; Feedback; Lighting; Optical bistability; Optical surface waves; Physics; Signal processing; Surface acoustic waves; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control Symposium, 1993. 47th., Proceedings of the 1993 IEEE International
Conference_Location
Salt Lake City, UT
Print_ISBN
0-7803-0905-7
Type
conf
DOI
10.1109/FREQ.1993.367437
Filename
367437
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