Title :
Automatic equipment for refractive indexes determination of isotropic and anisotropic materials on the basis of Michelson interferometer
Author :
Andrushchak, A.S. ; Kaidan, M.V. ; Klymash, M.M. ; Kolodij, R.S. ; Shemetc, S.O. ; Stryhalyuk, B.M.
Author_Institution :
Lviv Polytechnics Nat. Univ.
Abstract :
The automatic interferometric equipment for refractive indexes determination of isotropic and anisotropic materials with help of computer has been created at the Telecommunication department of the Lviv Polytechnics National University is discussed in this paper
Keywords :
Michelson interferometers; optical materials; refractive index measurement; Lviv Polytechnics National University; anisotropic materials; automatic interferometric equipment; isotropic materials; refractive indexes determination; Anisotropic magnetoresistance; Control systems; Mirrors; Optical control; Optical interferometry; Photodetectors; Refractive index; Stimulated emission; Telecommunication computing; Telecommunication control;
Conference_Titel :
Advanced Optoelectronics and Lasers, 2003. Proceedings of CAOL 2003. First International Conference on
Conference_Location :
Alushta, Crimea
Print_ISBN :
0-7803-7948-9
DOI :
10.1109/CAOL.2003.1251302
