Title :
Definition of surface roughness and orientation in polymeric films
Author :
Verbitsky, V.P. ; Galkin, A.A. ; Kravchenko, V.I. ; Savenkov, S.N.
Author_Institution :
Inst. of Appl. Problems of Phys. & Biophys., Nat. Acad. of Sci. of Ukraine, Kiev
Abstract :
Usage of a polarymetric method for definition of the orientation order gives in measurement errors owing to influence of a surface roughness. The method of definition of parameters of an anisotropy grounded on transformation of Mueller matrix in a matrix of a coherence and its subsequent transformation to the determined matrixes allows considerably to simplify interpretation of a polarymetric measuring. The measuring have shown, that the entropy of the matrix of a coherence for the majority of polymeric films and lenses does not exceed 0,4, that allows to spot parameters of an anisotropy
Keywords :
lenses; matrix algebra; optical films; optical polymers; polarimetry; surface roughness; Mueller matrix; lenses; measurement errors; polarymetric measurment; polarymetric method; polymeric films; surface roughness; Anisotropic magnetoresistance; Biophysics; Entropy; Geometrical optics; Measurement errors; Optical films; Polarization; Polymer films; Rough surfaces; Surface roughness;
Conference_Titel :
Advanced Optoelectronics and Lasers, 2003. Proceedings of CAOL 2003. First International Conference on
Conference_Location :
Alushta, Crimea
Print_ISBN :
0-7803-7948-9
DOI :
10.1109/CAOL.2003.1251304
