Title :
Delta function model analysis of SSBW spurious response in SAW devices
Author :
Hashimoto, Ken-Ya ; Yamaguchi, Masatsune
Author_Institution :
Dept. of Electr. & Electron. Eng., Chiba Univ., Japan
Abstract :
The authors propose a delta function model analysis of surface skimming bulk wave (SSBW) response by defining two physical parameters, KB2 and Xc, characterizing SSBW excitation and propagation. KB2 corresponds to the electromechanical coupling factor of surface acoustic waves (SAWs) and gives the SSBW excitation strength on the substrate surface. Xc is the critical propagation length representing how SSBW amplitudes decay with propagation. The analysis was applied to the characterization of a SAW TV-IF (intermediate frequency) filter fabricated on an X-112°Y-LiTaO3 substrate. The results obtained by the analysis were in good agreement with experiments, and clearly showed how the SSBW response affects the filter performance. The values of KB2 and Xc were determined for an SiO2-film/36°YX-LiTaO3 substrate which may be used for SAW devices, and its SSBW spurious response level was estimated. It was theoretically predicted and experimentally confirmed that the SSBW excitation stength and SSBW spurious response are considerably reduced by properly choosing the thickness of the SiO2 -film
Keywords :
VHF filters; electromechanical effects; lithium compounds; surface acoustic wave filters; 40 to 180 MHz; LiTaO3; SAW TV-IF filter; SAW devices; SSBW amplitudes decay; SSBW excitation; SSBW excitation strength; SSBW propagation; SSBW spurious response; SiO2-LiTaO3; critical propagation length; delta function model analysis; electromechanical coupling factor; intermediate frequency filter; surface skimming bulk wave; Acoustic materials; Acoustic propagation; Acoustic waves; Acoustical engineering; Crystalline materials; Filters; Performance analysis; Surface acoustic wave devices; Surface acoustic waves; Temperature;
Conference_Titel :
Frequency Control Symposium, 1993. 47th., Proceedings of the 1993 IEEE International
Conference_Location :
Salt Lake City, UT
Print_ISBN :
0-7803-0905-7
DOI :
10.1109/FREQ.1993.367455