• DocumentCode
    2375153
  • Title

    Parameter estimation of non-linear neuronal systems by linear association

  • Author

    Durand, D.M. ; Tawfik, Bassel

  • Author_Institution
    Dept. of Biomed. Eng., Case Western Reserve Univ., Cleveland, OH, USA
  • fYear
    1994
  • fDate
    1994
  • Firstpage
    1126
  • Abstract
    Linear associative memories (LAM) have been used intensely in the areas of pattern recognition and parallel processing for the past two decades. Application of LAM to nonlinear parameter estimation, however, has only been recently attempted. The process consists in converting the nonlinear function of the parameters into a set of linear algebraic equations. Here, LAM is applied to a nonlinear 5-parameter model of the neuron. Ill-conditioning, which is often exhibited in LAM, is treated with the method of regularization as well as by the singular value decomposition (SVD). Simulation results indicate that the parameters estimated by LAM exhibit a remarkable robustness against additive white noise in comparison with the classical gradient optimization technique. The comparison between LAM and a gradient technique show that, for this estimation problem, the LAM method can give more reliable estimates. Further improvements in estimation quality may still be achieved by other forms of regularizing functions
  • Keywords
    parameter estimation; additive white noise; classical gradient optimization technique; estimation quality; ill-conditioning; linear association; linear associative memories; nonlinear neuronal systems; regularization method; regularizing functions; Associative memory; Biomedical engineering; Laplace equations; Neurons; Noise robustness; Nonlinear equations; Parameter estimation; Pattern recognition; Singular value decomposition; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 1994. Engineering Advances: New Opportunities for Biomedical Engineers. Proceedings of the 16th Annual International Conference of the IEEE
  • Conference_Location
    Baltimore, MD
  • Print_ISBN
    0-7803-2050-6
  • Type

    conf

  • DOI
    10.1109/IEMBS.1994.415356
  • Filename
    415356