• DocumentCode
    2375241
  • Title

    Improved sapphire dielectric resonators for ultrastable oscillators

  • Author

    Luiten, A.N. ; Mann, A.G. ; Blair, D.G.

  • Author_Institution
    Dept. of Phys., Univ. of Western Australia, Nedlands, WA, Australia
  • fYear
    1993
  • fDate
    2-4 Jun 1993
  • Firstpage
    757
  • Lastpage
    762
  • Abstract
    It is shown that, in 5 cm Crystal Systems "HEMEX" resonators, unloaded Q values, not limited by wall losses, of 5-8 × 109 at 2 K and 3 × 109 at 6 K are possible. Frequency-temperature self-compensation, in which the temperature dependence of the real part of the AC susceptibility of paramagnetic impurities balances that due to the dielectric constant of the sapphire, can be achieved in H modes at convenient operating temperatures. Because chromium and iron concentrations are very small, ions with very high frequency ESRs provide essentially frequency-independent self-compensation, allowing freedom of choice of operating frequency. The dominant paramagnetic ion has been identified as Mo3+. Since the Mo3+ concentration is essentially fixed by the crystal growth process, and one desires the lowest possible frequency-temperature coefficient and dielectric loss, the Hm11 modes are the best candidates for high-stability HEMEX resonators. The observed power dependence of mode frequency, ~10-8 W-1, will require that resonator power fluctuations be maintained at less than 100 nW if a frequency stability of 1 × 10 -15 is to be achieved
  • Keywords
    Q-factor; cavity resonators; dielectric resonator oscillators; frequency stability; microwave oscillators; sapphire; 12 GHz; 2 K; 5 cm; 6 K; AC susceptibility; Al2O3; ESR; HEMEX resonators; Mo3+ concentration; crystal growth process; dielectric constant; frequency stability; frequency-temperature coefficient; frequency-temperature self-compensation; mode frequency; paramagnetic impurities; paramagnetic ion; power dependence; resonator power fluctuations; sapphire dielectric resonators; ultrastable oscillators; unloaded Q values; wall losses; Chromium; Dielectric constant; Dielectric losses; Frequency; Impurities; Iron; Oscillators; Paramagnetic materials; Paramagnetic resonance; Temperature dependence;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 1993. 47th., Proceedings of the 1993 IEEE International
  • Conference_Location
    Salt Lake City, UT
  • Print_ISBN
    0-7803-0905-7
  • Type

    conf

  • DOI
    10.1109/FREQ.1993.367474
  • Filename
    367474