Title :
Improved sapphire dielectric resonators for ultrastable oscillators
Author :
Luiten, A.N. ; Mann, A.G. ; Blair, D.G.
Author_Institution :
Dept. of Phys., Univ. of Western Australia, Nedlands, WA, Australia
Abstract :
It is shown that, in 5 cm Crystal Systems "HEMEX" resonators, unloaded Q values, not limited by wall losses, of 5-8 × 109 at 2 K and 3 × 109 at 6 K are possible. Frequency-temperature self-compensation, in which the temperature dependence of the real part of the AC susceptibility of paramagnetic impurities balances that due to the dielectric constant of the sapphire, can be achieved in H modes at convenient operating temperatures. Because chromium and iron concentrations are very small, ions with very high frequency ESRs provide essentially frequency-independent self-compensation, allowing freedom of choice of operating frequency. The dominant paramagnetic ion has been identified as Mo3+. Since the Mo3+ concentration is essentially fixed by the crystal growth process, and one desires the lowest possible frequency-temperature coefficient and dielectric loss, the Hm11 modes are the best candidates for high-stability HEMEX resonators. The observed power dependence of mode frequency, ~10-8 W-1, will require that resonator power fluctuations be maintained at less than 100 nW if a frequency stability of 1 × 10 -15 is to be achieved
Keywords :
Q-factor; cavity resonators; dielectric resonator oscillators; frequency stability; microwave oscillators; sapphire; 12 GHz; 2 K; 5 cm; 6 K; AC susceptibility; Al2O3; ESR; HEMEX resonators; Mo3+ concentration; crystal growth process; dielectric constant; frequency stability; frequency-temperature coefficient; frequency-temperature self-compensation; mode frequency; paramagnetic impurities; paramagnetic ion; power dependence; resonator power fluctuations; sapphire dielectric resonators; ultrastable oscillators; unloaded Q values; wall losses; Chromium; Dielectric constant; Dielectric losses; Frequency; Impurities; Iron; Oscillators; Paramagnetic materials; Paramagnetic resonance; Temperature dependence;
Conference_Titel :
Frequency Control Symposium, 1993. 47th., Proceedings of the 1993 IEEE International
Conference_Location :
Salt Lake City, UT
Print_ISBN :
0-7803-0905-7
DOI :
10.1109/FREQ.1993.367474