Title :
Microwave oscillators incorporating cryogenic sapphire dielectric resonators
Author :
Flory, C.A. ; Taber, R.C.
Author_Institution :
Hewlett-Packard Lab., Palo Alto, CA, USA
Abstract :
Progress is reported on efforts to develop a commercially viable high-purity X-band signal source incorporating a cryogenic sapphire dielectric resonator. The resonator design is of the whispering gallery type to take advantage of the excellent electromagnetic field confinement offered by this geometry. Complications resulting from the high spurious mode density of this type of resonator have been eliminated by developing a very accurate and complete mode analysis program which fully incorporates the dielectric anisotropies of the sapphire ring. This program allows the design of a window in the frequency domain where no unwanted modes exist, with accurate placement of the desired mode at the center of this region. The phase noise properties of simple oscillators incorporating these resonators have been evaluated. Two-oscillator phase noise comparison measurements have yielded extremely encouraging results
Keywords :
cavity resonators; circuit CAD; cryogenic electronics; dielectric resonator oscillators; frequency-domain synthesis; microwave oscillators; phase noise; sapphire; Al2O3; X-band signal source; cryogenic sapphire dielectric resonator; dielectric anisotropies; electromagnetic field confinement; frequency domain; microwave oscillator; mode analysis program; phase noise; sapphire ring; spurious mode density; whispering gallery resonator; Anisotropic magnetoresistance; Cryogenics; Dielectrics; Electromagnetic fields; Frequency domain analysis; Geometry; Microwave oscillators; Noise measurement; Phase measurement; Phase noise;
Conference_Titel :
Frequency Control Symposium, 1993. 47th., Proceedings of the 1993 IEEE International
Conference_Location :
Salt Lake City, UT
Print_ISBN :
0-7803-0905-7
DOI :
10.1109/FREQ.1993.367475