DocumentCode :
2375629
Title :
A 1.1V 35μm × 35μm thermal sensor with supply voltage sensitivity of 2°C/10%-supply for thermal management on the SX-9 supercomputer
Author :
Saneyoshi, Eisuke ; Nose, Koichi ; Kajita, Mikihiro ; Mizuno, Masayuki
Author_Institution :
Device Platforms Res. Labs., NEC Corp., Sagamihara
fYear :
2008
fDate :
18-20 June 2008
Firstpage :
152
Lastpage :
153
Abstract :
Presented here is a thermal sensor, based on transistor off-leakage current, that allows measurement error of less than 3.1degC at 90degC and less than 2degC at 10% Vdd deviation. For experimental evaluation, 11 thermal sensors, each of which occupied only 35 mum times 35 mum area, were placed on a chip, and both the location of a hotspot and the overall temperature distribution were successfully measured and agreed with simulation.
Keywords :
leakage currents; parallel machines; temperature distribution; temperature sensors; transistors; SX-9 supercomputer; supply voltage sensitivity; thermal management; thermal sensors; transistor off-leakage currents; Diodes; Regulators; Sensor systems; Supercomputers; Temperature measurement; Temperature sensors; Thermal management; Thermal sensors; Velocity measurement; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Circuits, 2008 IEEE Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-1804-6
Electronic_ISBN :
978-1-4244-1805-3
Type :
conf
DOI :
10.1109/VLSIC.2008.4585987
Filename :
4585987
Link To Document :
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