Title :
Model of IC emissions into a TEM cell
Author_Institution :
Motorola Inc., Austin, TX, USA
Abstract :
A rigorous, full-wave computer model of an arbitrarily oriented IC-like source in a TEM cell and supporting measurements are presented. The mechanism by which power is delivered from the TEM cell is quantified, the relation between measurements taken in the TEM cell and above a ground plane is determined for some simple structures, and a method which models the contributions of a particular IC function to the total IC emissions is demonstrated. The TEM cell is specified by the Society of Automotive Engineers´ recommended practice for measuring IC emissions
Keywords :
electric field measurement; electromagnetic compatibility; electromagnetic interference; integrated circuits; magnetic field measurement; IC emissions measurement; Society of Automotive Engineers; TEM cell; full-wave computer model; ground plane; recommended practice; total IC emissions; Coupling circuits; Electromagnetic compatibility; Frequency; Integrated circuit modeling; Integrated circuit noise; Particle measurements; Power measurement; Power system modeling; Resonance; TEM cells;
Conference_Titel :
Electromagnetic Compatibility, 1997. IEEE 1997 International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-4140-6
DOI :
10.1109/ISEMC.1997.667568
