Simultaneous switching noise: influence of plane-plane and plane-signal trace coupling

Author

Vaidyanath, Arun ; Prince, Jerry L. ; Cangellaris, Andreas C.

Author_Institution

Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ

fYear

1994

fDate

1-4 May 1994

Firstpage

957

Lastpage

961

Abstract

The paper presents an aspect of Simultaneous Switching Noise (SSN) for CMOS drivers in packages with power distribution planes. The analysis takes into account the interactions between power distribution planes and signal traces. Coupling between these have a significant effect on the noise and must be taken into account. A model for the interaction between the signal conductors and the current paths in the power distribution planes is presented. The presence of the signal conductors is seen to have a significant impact on the SSN. The magnitude of the noise is strongly dependent on the relative positions of the signal conductors and the power and ground plane pin connections. Power and ground planes sufficiently close to each other also have significant mutual inductive coupling. This coupling will cause noise to be observed in both distribution planes, even though switching current flows in only one plane. This effect is explained

Keywords

CMOS digital integrated circuits; driver circuits; integrated circuit modelling; integrated circuit noise; integrated circuit packaging; CMOS drivers; current paths; ground plane pin connections; model; multilayer packages; mutual inductive coupling; plane-plane coupling; plane-signal trace coupling; power distribution planes; power plane pin connections; signal conductors; simultaneous switching noise; Conductors; Coupling circuits; Driver circuits; Electronics packaging; Inductance; Mutual coupling; Nonhomogeneous media; Pins; Power distribution; Signal analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronic Components and Technology Conference, 1994. Proceedings., 44th

Conference_Location

Washington, DC

Print_ISBN

0-7803-0914-6

Type

conf

DOI

10.1109/ECTC.1994.367513

Filename

367513