Directional correlation of the irradiated energy from a microcontroller chip

Author

Zikic, A.M. ; Galbraith, F.S. ; Davenport, N.

Author_Institution

Univ. of Paisley, UK

fYear

1997

fDate

18-22 Aug 1997

Firstpage

218

Lastpage

222

Abstract

The paper proposes an analysis technique of the emission spectra, obtained by using SAE N^oJ1752/3 procedure, that may be of interest to both the manufacturing and application communities. The results are used to establish the number, origin, directionality and relationship of detected sources. If a number of the emission spectra have essentially the same distribution of power over the frequency range of interest, the directions are treated as correlated. The technique is illustrated by an example using recorded data from an unknown microcontroller source

Keywords

electromagnetic interference; microcontrollers; spectral analysis; Pearson´s correlation test; SAE N^oJ1752/3 procedure; detected sources; directional correlation; emission spectra; irradiated energy; microcontroller chip; recorded data; significant difference analysis; spectral analysis; system clock influences; unknown microcontroller source; Chip scale packaging; Clocks; Electromagnetic compatibility; Frequency; Microcontrollers; Power harmonic filters; Power measurement; Pulp manufacturing; Silicon; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 1997. IEEE 1997 International Symposium on

Conference_Location

Austin, TX

Print_ISBN

0-7803-4140-6

Type

conf

DOI

10.1109/ISEMC.1997.667572

Filename

667572