DocumentCode :
2376077
Title :
A 0.6V 45nm adaptive dual-rail SRAM compiler circuit design for lower VDD_min VLSIs
Author :
Chen, Y.H. ; Chan, W.M. ; Chou, S.Y. ; Liao, H.J. ; Pan, H.Y. ; Wu, J.J. ; Lee, C.H. ; Yang, S.M. ; Liu, Y.C. ; Yamauchi, H.
Author_Institution :
DTP, Taiwan Semicond. Manuf. Co., Ltd., Hsinchu
fYear :
2008
fDate :
18-20 June 2008
Firstpage :
210
Lastpage :
211
Abstract :
A 0.6 V 45 nm dual-rail SRAM design utilizing an adaptive voltage regulator targeting for an SRAM compiler application is proposed for the first time. The proposed work describes an adaptive mechanism to generate a cell-Vdd (CVDD), which tracks a certain voltage offset with respect to logic-Vdd (VDD), and provides a mean to lower the VDD down to 0.6 V. To relax IR-drop constraints of CVDD power routings in P&R flow, shifting bite-line (BL) pre-charge power supply from CVDD to VDD is adopted in this work. This also avoids the congestion of the VDD and CVDD power mesh. A 45 nm test chip has demonstrated that these concepts successfully can push the VDD_min down to 0.6 V, which is > 250 mV lower than the conventional single-rail SRAMpsilas.
Keywords :
SRAM chips; VLSI; memory architecture; CVDD power routings; VDD_min VLSI; adaptive voltage regulator; bite-line pre-charge power supply; dual-rail SRAM compiler circuit design; size 45 nm; voltage 0.6 V; Circuit synthesis; Power generation; Power supplies; Random access memory; Regulators; Routing; Target tracking; Testing; Very large scale integration; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Circuits, 2008 IEEE Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-1804-6
Electronic_ISBN :
978-1-4244-1805-3
Type :
conf
DOI :
10.1109/VLSIC.2008.4586010
Filename :
4586010
Link To Document :
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