• DocumentCode
    2376128
  • Title

    Reliable Au-Sn flip chip bonding on flexible prints

  • Author

    Baggerman, A.F.J. ; Batenburg, M.J.

  • Author_Institution
    Philips Centre for Manuf. Technol., Eindhoven, Netherlands
  • fYear
    1994
  • fDate
    1-4 May 1994
  • Firstpage
    900
  • Lastpage
    905
  • Abstract
    Au-Sn flip chip bonding is successfully introduced for the mounting of integrated circuits on flexible polyimide prints. Flip chip was used, since in most consumer electronics, and more specific for hearing instruments the useable volume is decreasing very rapidly. Since on the same flex print reflow soldering of other components is required, a high melting soldering process is preferred. An additional advantage of the Au-Sn process is that the bumps do not completely melt, and a certain stand off height is guaranteed. The bumps are deposited on top of the bondpads and are bonded to Cu tracks on a polyimide foil. The required Sn is either deposited on the bump or on the Cu tracks. Both Au-Sn soldering processes are performed by using pulsed heat thermode (gang) bonding. It is found that the quality of the bonds depends on the microstructure formed in the bonding region. EDX measurements indicate that for good quality bonds eutectic (80/20) Au-Sn or ζ´phases are required. To obtain these phases the temperature at the interface and the initial amount of Sn are optimized
  • Keywords
    circuit reliability; flip-chip devices; gold alloys; microassembling; printed circuit manufacture; printed circuit testing; tin alloys; Au-Sn flip chip bonding; AuSn-Cu; Cu; Cu tracks; EDX measurements; IC mounting; bond quality; eutectic (80/20) Au-Sn phase; flexible polyimide prints; gang bonding; high melting soldering process; integrated circuit; pulsed heat thermode bonding; reflow soldering; reliable bonding; zeta/´phase; Auditory system; Bonding; Consumer electronics; Flip chip; Instruments; Integrated circuit reliability; Microstructure; Polyimides; Reflow soldering; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1994. Proceedings., 44th
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-7803-0914-6
  • Type

    conf

  • DOI
    10.1109/ECTC.1994.367522
  • Filename
    367522