DocumentCode :
2376135
Title :
An integrated and improved dispatching approach to reduce cycle time of wet etch and furnace operations in semiconductor fabrication
Author :
Chang, Chia-Yu ; Chang, Kuo-Hao
Author_Institution :
Dept. of Ind. Eng. & Eng. Manage., Nat. Tsing Hua Univ., Hsinchu, Taiwan
fYear :
2012
fDate :
23-25 May 2012
Firstpage :
734
Lastpage :
741
Abstract :
The dispatching rules for the process of wet etch and furnace are complex due to the multiple considerations of waiting time constraints, batch size forming, and load balancing. This paper proposes an effective three-stage approach based on multi-factors selection, integrating developed dispatching rules and LR-ratio method, to decide the most appropriate scheduler and sequencing order. To verify the viability of the proposed approach, we conduct an empirical study based on real data collected in a semiconductor manufacturing. A simulation model is constructed and the proposed method is applied for evaluating its performance. Numerical results show that the developed approach can significantly reduce the cycle time by 8% compared to the existing approach.
Keywords :
batch processing (industrial); dispatching; etching; furnaces; lead time reduction; order processing; scheduling; semiconductor device manufacture; LR ratio method; batch size forming; cycle time reduction; dispatching rules; furnace operations; load balancing; order sequencing; scheduler; semiconductor fabrication; semiconductor manufacturing; waiting time constraints; wet etch process; Argon; Furnaces; Numerical models; Batch size; Dispatching rules; Scheduling; Sequencing; Simulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Supported Cooperative Work in Design (CSCWD), 2012 IEEE 16th International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4673-1211-0
Type :
conf
DOI :
10.1109/CSCWD.2012.6221901
Filename :
6221901
Link To Document :
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