DocumentCode
237650
Title
Insight extraction for semiconductor manufacturing processes
Author
Pampuri, Simone ; Susto, Gian Antonio ; Jian Wan ; Johnston, Adrian ; O´Hara, Paul ; McLoone, S.
Author_Institution
Nat. Univ. of Ireland, Maynooth, Ireland
fYear
2014
fDate
18-22 Aug. 2014
Firstpage
786
Lastpage
791
Abstract
In the semiconductor manufacturing environment it is very important to understand which factors have the most impact on process outcomes and to control them accordingly. This is usually achieved through design of experiments at process start-up and long term observation of production. As such it relies heavily on the expertise of the process engineer. In this work, we present an automatic approach to extracting useful insights about production processes and equipment based on state-of-the-art Machine Learning techniques. The main goal of this activity is to provide tools to process engineers to accelerate the learning-by-observation phase of process analysis. Using a Metal Deposition process as an example, we highlight various ways in which the extracted information can be employed.
Keywords
design of experiments; learning (artificial intelligence); production engineering computing; production equipment; semiconductor industry; design of experiments; information extraction; learning-by-observation phase; machine learning techniques; metal deposition process; process analysis; process engineer; production equipment; production processes; semiconductor manufacturing environment; semiconductor manufacturing processes; Adaptation models; Data mining; Metrology; Predictive models; Production; Semiconductor device modeling; Training; Metal Deposition; Moving Window; Semiconductor Manufacturing; Sparse Regression; Virtual Metrology;
fLanguage
English
Publisher
ieee
Conference_Titel
Automation Science and Engineering (CASE), 2014 IEEE International Conference on
Conference_Location
Taipei
Type
conf
DOI
10.1109/CoASE.2014.6899415
Filename
6899415
Link To Document