Title :
An adaptive machine learning decision system for flexible predictive maintenance
Author :
Susto, Gian Antonio ; Wan, Jianwei ; Pampuri, Simone ; Zanon, Mario ; Johnston, Adrian B. ; O´Hara, Paul G. ; McLoone, S.
Author_Institution :
Nat. Univ. of Ireland, Maynooth, Ireland
Abstract :
Process monitoring and Predictive Maintenance (PdM) are gaining increasing attention in most manufacturing environments as a means of reducing maintenance related costs and downtime. This is especially true in industries that are data intensive such as semiconductor manufacturing. In this paper an adaptive PdM based flexible maintenance scheduling decision support system, which pays particular attention to associated opportunity and risk costs, is presented. The proposed system, which employs Machine Learning and regularized regression methods, exploits new information as it becomes available from newly processed components to refine remaining useful life estimates and associated costs and risks. The system has been validated on a real industrial dataset related to an Ion Beam Etching process for semiconductor manufacturing.
Keywords :
cost reduction; decision support systems; etching; flexible manufacturing systems; ion beam applications; learning (artificial intelligence); maintenance engineering; process monitoring; regression analysis; remaining life assessment; scheduling; semiconductor industry; adaptive PdM based flexible maintenance scheduling decision support system; adaptive machine learning decision system; data intensive industries; downtime reduction; flexible predictive maintenance; industrial dataset; ion beam etching process; maintenance cost reduction; manufacturing environments; opportunity costs; process monitoring; regularized regression methods; remaining useful life estimation; risk costs; semiconductor manufacturing; Etching; Feature extraction; Ion beams; Manufacturing; Predictive maintenance; Principal component analysis; Feature Extraction; Industrial Modeling; Optical Emission Spectroscopy; Predictive Maintenance; Regularization Methods; Semiconductor Manufacturing; Sparse Principal Component Analysis;
Conference_Titel :
Automation Science and Engineering (CASE), 2014 IEEE International Conference on
Conference_Location :
Taipei
DOI :
10.1109/CoASE.2014.6899418