2376640

Proceedings International Test Conference 2002 (Cat. No.02CH37382)

2002

10-10 Oct. 2002

analogue integrated circuits; automatic test equipment; automatic testing; built-in self test; design for testability; digital integrated circuits; failure analysis; fault diagnosis; integrated circuit testing; logic testing; micromechanical devices; mixed analogue-digital integrated circuits; printed circuit testing; production testing; system-on-chip; testing; timing; ATE; ATPG; BIST; DFT; FPGA testing; IDDQ testing; MEMS; RF testing; SoC testing; diagnostic techniques; embedded test; jitter testing; memory testing; microprocessor debugging; mixed-signal test techniques; online testing; test data compression; timing measurements; yield model validation;

English

ieee

Test Conference, 2002. Proceedings. International

Baltimore, MD, USA

1089-3539

0-7803-7542-4

conf

10.1109/TEST.2002.1041741

1041741