• DocumentCode
    2376714
  • Title

    Modeling, simulation, and analysis of stator windings of induction machines in high frequencies

  • Author

    Zhao, Zhengming ; Kendig, Martin ; Rogovin, Dan

  • Author_Institution
    Dept. of Electr. Eng., Tsinghua Univ., Beijing, China
  • Volume
    1
  • fYear
    1998
  • fDate
    12-15 Oct. 1998
  • Firstpage
    259
  • Abstract
    The paper offers a modeling method for obtaining the broad band impedance response of three phase induction machines for different measuring situations. Our motivation for this work is the contributions of inverter driven machines operating at variable speeds on the idea of research. Variable capacitance and core loss resistance are viewed as important parameters in the modeling. The equivalent circuits for three measuring configurations are discussed and derived. Simulation and experiment results for different measurements are compared to verify the validation of the models. Parameters identification and sensitivity analysis in the model are conducted to obtain more accurate parameters and their behaviour in frequency response.
  • Keywords
    capacitance; electric impedance; electric resistance; equivalent circuits; frequency response; induction motor drives; invertors; losses; machine theory; magnetic cores; parameter estimation; sensitivity analysis; stators; variable speed drives; broad band impedance response; core loss resistance; equivalent circuits; frequency response; high frequencies; induction machines; inverter driven machines; measuring situations; modeling; parameters identification; sensitivity analysis; simulation; stator windings analysis; three phase induction machines; variable capacitance; variable speeds; Analytical models; Capacitance; Core loss; Electrical resistance measurement; Equivalent circuits; Impedance measurement; Induction machines; Inverters; Phase measurement; Stator windings;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 1998. Thirty-Third IAS Annual Meeting. The 1998 IEEE
  • Conference_Location
    St. Louis, MO, USA
  • ISSN
    0197-2618
  • Print_ISBN
    0-7803-4943-1
  • Type

    conf

  • DOI
    10.1109/IAS.1998.732301
  • Filename
    732301