• DocumentCode
    2376842
  • Title

    Standards-compliant LTE and LTE-A uplink power control

  • Author

    Zhang, Honghai ; Prasad, Narayan ; Rangarajan, Sampath ; Mekhail, Sherif ; Said, Said ; Arnott, Rob

  • Author_Institution
    NEC Labs. America, Princeton, NJ, USA
  • fYear
    2012
  • fDate
    10-15 June 2012
  • Firstpage
    5275
  • Lastpage
    5279
  • Abstract
    In LTE and LTE-Advanced uplink, the interference power in a cell depends on the user scheduling and power assignment in neighboring cells. As a result, it is hard to accurately estimate the signal-to-interference-plus-noise ratio (SINR) values and make the right MCS (Modulation and Coding Scheme) selection. To address this challenge, we propose open-loop and closed-loop power control schemes to reduce both the average and the variance of the interference power in order to improve the system performance. It is shown that compared to the existing fractional power control (FPC) in LTE, the proposed schemes improve the cell-average throughput by 7-8% while maintaining the same cell-edge throughput in networks with low penetration loss, and improve the cell-average throughput by 4-6% and the cell-edge throughput by 15-23% in networks with high penetration loss.
  • Keywords
    Long Term Evolution; closed loop systems; interference (signal); modulation coding; open loop systems; signal processing; telecommunication standards; FPC; LTE-A uplink power control; LTE-advanced uplink; MCS selection; SINR values; cell-average throughput; cell-edge throughput; closed-loop power control schemes; fractional power control; interference power; modulation and coding scheme selection; open-loop power control schemes; penetration loss; power assignment; signal-to-interference-plus-noise ratio values; standards-compliant LTE; system performance; user scheduling; Interference; Power control; Shadow mapping; Signal to noise ratio; System performance; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications (ICC), 2012 IEEE International Conference on
  • Conference_Location
    Ottawa, ON
  • ISSN
    1550-3607
  • Print_ISBN
    978-1-4577-2052-9
  • Electronic_ISBN
    1550-3607
  • Type

    conf

  • DOI
    10.1109/ICC.2012.6364333
  • Filename
    6364333