• DocumentCode
    2376930
  • Title

    The importance of material selection for flip chip on board assemblies

  • Author

    Malley, Grace O. ; Giesler, Jan ; Machuga, Steve

  • Author_Institution
    Assembly Technol. Res. Group, Motorola Corp. Manuf. Res. Center, Schaumburg, IL, USA
  • fYear
    1994
  • fDate
    1-4 May 1994
  • Firstpage
    387
  • Lastpage
    394
  • Abstract
    Flip chip technology, where the unpackaged silicon chip is assembled directly to an organic substrate, provides an unique interconnect structure that significantly reduces the substrate area required by traditional surface mount integrated circuit packages. Without the protection for the chip that a package body affords however, reduced mechanical robustness and a decrease in reliability performance are potential concerns. In addition, the inherent thermal mismatch between the chip and substrate, particularly with an organic printed circuit board, will produce an accumulation of stress in the solder joints under normal operating conditions that can result in relatively premature failures. Coupling the chip and substrate together with an encapsulation material under the chip face has successfully overcome these mechanical and reliability issues. However, the success of the encapsulation is dependent on many factors. Among these are the encapsulant´s material properties, and its compatibility with the chip and substrate surfaces. Thus, the selection of the basic materials to be used in the Flip Chip on Board (FCOB) assembly are interrelated and critical to the subsequent performance of the completed assembly
  • Keywords
    encapsulation; flip-chip devices; microassembling; printed circuit manufacture; surface mount technology; FCOB assembly; encapsulation material; flip chip on board assemblies; interconnect structure; material selection; organic substrate; Assembly; Encapsulation; Flip chip; Integrated circuit interconnections; Integrated circuit packaging; Integrated circuit technology; Protection; Silicon; Surface-mount technology; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1994. Proceedings., 44th
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-7803-0914-6
  • Type

    conf

  • DOI
    10.1109/ECTC.1994.367560
  • Filename
    367560