DocumentCode :
2376972
Title :
Verifying properties using sequential ATPG [IC design]
Author :
Abraham, J.A. ; Vedula, V.M.
Author_Institution :
Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA
fYear :
2002
fDate :
2002
Firstpage :
194
Lastpage :
202
Abstract :
This paper develops a novel approach for formally verifying both safety and liveness properties of designs using sequential ATPG tools. The properties are automatically mapped into a monitor circuit with a target fault so that finding a test for the fault corresponds to formally establishing the property. The mapping of the properties to the monitor circuit is described in detail and the process is shown to be sound and complete. Experimental results show that the ATPG-based approach performs better than existing verification techniques, especially for large designs.
Keywords :
automatic test pattern generation; formal verification; integrated circuit design; integrated circuit modelling; integrated circuit testing; performance evaluation; IC design property formal verification techniques; benchmark testing; design safety/liveness properties; fault test generation; integrated circuit design validation; monitor circuit target faults; property automatic monitor circuit mapping; property formal establishment; sequential ATPG tools; Automatic test pattern generation; Boolean functions; Circuit faults; Circuit testing; Data structures; Design engineering; Jacobian matrices; Logic; Protons; Safety;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2002. Proceedings. International
ISSN :
1089-3539
Print_ISBN :
0-7803-7542-4
Type :
conf
DOI :
10.1109/TEST.2002.1041761
Filename :
1041761
Link To Document :
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