• DocumentCode
    2376987
  • Title

    The relationship between conductivity uncertainties and EEG source localization accuracy

  • Author

    Wang, Gang ; Yang, Lin ; Worrell, Gregory ; He, Bin

  • Author_Institution
    Dept. of Biomed. Eng., Univ. of Minnesota, Minneapolis, MN, USA
  • fYear
    2009
  • fDate
    3-6 Sept. 2009
  • Firstpage
    4799
  • Lastpage
    4802
  • Abstract
    The brain-to-skull conductivity ratio (BSCR) is an important parameter in EEG source imaging and localization. Misspecification of this value may introduce localization errors in the estimation of brain electrical activity. However, the effect of this ratio has not been well understood despite many investigations. In the present study, we conducted a series of computer simulations to investigate the relationship between BSCR and EEG source localization accuracy. Furthermore, we have attempted to correlate the localization accuracy of epileptogenic regions with the BSCR in epilepsy patients. Our results indicate that the dipole localization errors ranged from 10 to 20 mm. The localization accuracy resulting when the conductivity ratio used in the inverse calculation was set at 20 was better than those resulting when the ratio was set at 80 in epilepsy patients with a deep tumor. Future work is needed to validate this finding by experimental investigations in a large patient population.
  • Keywords
    bioelectric phenomena; bone; electrical conductivity measurement; electroencephalography; tumours; EEG source imaging; EEG source localisation accuracy; brain electrical activity; brain-skull conductivity ratio; computer simulations; conductivity uncertainty; deep tumor; epilepsy patient BSCR; epileptogenic regions; Brain; Brain Mapping; Electroencephalography; Epilepsy; Humans;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2009. EMBC 2009. Annual International Conference of the IEEE
  • Conference_Location
    Minneapolis, MN
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-3296-7
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2009.5332637
  • Filename
    5332637