Title :
Automatic extraction of contour lines and feature points from profile images
Author :
Okamoto, N. ; Chen, W. ; Iida, N. ; Minami, T.
Author_Institution :
Coll. of Eng., Kanto Gakuin Univ., Yokohama, Japan
Abstract :
The paper proposes a new extraction algorithm for contour lines and feature points from profile images for automatic personal identification. First the authors input a side view of a human head within a dark background under uniform lighting conditions by a CCD camera, then transform the input to a color difference signal image. After enhancing edges of the image using Sobel operators they binarize the luminance level of each pixel and portray a black profile in a white background. Next they differentiate the black profile, binarize the differentiated results, and depict a contour line using a thinning operator. Finally they encode the extracted contour line using Freeman´s chain code and, using the encoded data, calculate the digital curvature in concave sections of the contour line and determine the concave feature points. Next they draw straight lines connecting the adjacent feature points and specify the convex feature points on the contour line which are farthest from the straight lines. They can obtain feature points of the profile automatically and reliably
Keywords :
biometrics (access control); edge detection; feature extraction; CCD camera; Sobel operators; automatic contour line extraction; automatic feature point extraction; automatic personal identification; binarized luminance level; black profile; chain code; color difference signal image; concave sections; dark background; digital curvature; edge enhancement; extracted contour line encoding; extraction algorithm; human head; pixel; profile images; side view; thinning operator; uniform lighting conditions; white background; Charge coupled devices; Charge-coupled image sensors; Colored noise; Data mining; Educational institutions; Feature extraction; Head; Histograms; Humans; Pixel;
Conference_Titel :
Electrical and Computer Engineering, 1997. Engineering Innovation: Voyage of Discovery. IEEE 1997 Canadian Conference on
Conference_Location :
St. Johns, Nfld.
Print_ISBN :
0-7803-3716-6
DOI :
10.1109/CCECE.1997.608372