Title :
XIDEN: crosstalk target identification framework
Author :
Nazarian, Shahin ; Huang, Hang ; Natarajan, Suriyaprakash ; Gupta, Sandeep K. ; Breuer, Melvin A.
Author_Institution :
Dept. of Electr. Eng., Univ. of Southern California, Los Angeles, CA, USA
Abstract :
An efficient crosstalk target identification framework called XIDEN has been developed that is used prior to the computationally expensive processes of crosstalk validation and test generation. XIDEN is mainly composed of a set of extractors and filters that together identify the prime crosstalk targets. These prime targets include all error producing targets, i.e. targets that can potentially create Boolean errors. A methodology has been developed to determine the sequence of extractors and filters to identify a small set of targets with low computational cost. The effects of process variation and extraction accuracy as well as complexity are considered in XIDEN. After performing a training process on sample circuits, XIDEN produces a set of effective extractor filter sequences to be used for production circuits.
Keywords :
Boolean functions; VLSI; crosstalk; error detection; integrated circuit noise; integrated circuit testing; logic testing; Boolean errors; VLSI; XIDEN; computational cost; crosstalk target identification framework; error producing targets; extraction accuracy; extractor filter sequences; logic description; logic error; prime crosstalk targets; process variation; production circuits; test generation; training process; Circuit faults; Circuit testing; Computational efficiency; Crosstalk; Delay effects; Filters; Pulse circuits; Signal processing; System testing; Timing;
Conference_Titel :
Test Conference, 2002. Proceedings. International
Print_ISBN :
0-7803-7542-4
DOI :
10.1109/TEST.2002.1041780