DocumentCode
2377280
Title
XIDEN: crosstalk target identification framework
Author
Nazarian, Shahin ; Huang, Hang ; Natarajan, Suriyaprakash ; Gupta, Sandeep K. ; Breuer, Melvin A.
Author_Institution
Dept. of Electr. Eng., Univ. of Southern California, Los Angeles, CA, USA
fYear
2002
fDate
2002
Firstpage
365
Lastpage
374
Abstract
An efficient crosstalk target identification framework called XIDEN has been developed that is used prior to the computationally expensive processes of crosstalk validation and test generation. XIDEN is mainly composed of a set of extractors and filters that together identify the prime crosstalk targets. These prime targets include all error producing targets, i.e. targets that can potentially create Boolean errors. A methodology has been developed to determine the sequence of extractors and filters to identify a small set of targets with low computational cost. The effects of process variation and extraction accuracy as well as complexity are considered in XIDEN. After performing a training process on sample circuits, XIDEN produces a set of effective extractor filter sequences to be used for production circuits.
Keywords
Boolean functions; VLSI; crosstalk; error detection; integrated circuit noise; integrated circuit testing; logic testing; Boolean errors; VLSI; XIDEN; computational cost; crosstalk target identification framework; error producing targets; extraction accuracy; extractor filter sequences; logic description; logic error; prime crosstalk targets; process variation; production circuits; test generation; training process; Circuit faults; Circuit testing; Computational efficiency; Crosstalk; Delay effects; Filters; Pulse circuits; Signal processing; System testing; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2002. Proceedings. International
ISSN
1089-3539
Print_ISBN
0-7803-7542-4
Type
conf
DOI
10.1109/TEST.2002.1041780
Filename
1041780
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