• DocumentCode
    2377487
  • Title

    Reliability and performance of non-hermetic, surface-mount quad flat packages

  • Author

    Guenin, Bruce M. ; Mahulikar, Deepak ; Leslie, David C. ; Holmes, Michael

  • Author_Institution
    Metals Res. Labs., Olin Corp., New Haven, CT, USA
  • fYear
    1994
  • fDate
    1-4 May 1994
  • Firstpage
    721
  • Lastpage
    727
  • Abstract
    A number of non-hermetic package formats are currently available for high leadcount, surface mount IC packaging applications. These include Plastic Quad Flat Packs [PQFPs], thermally enhanced PQFPs-with internal heat spreaders or exposed heat slugs, and Metal QFPs (known as MQUAD packages). Each package format with its unique design features can claim certain advantages in the areas of cost, reliability, and performance. Various modelling and empirical studies have been reported comparing these package formats in terms of baseline thermal performance. A comprehensive study involving thermal, electrical, and reliability performance has not heretofore been published. This paper reports the results of empirical studies performed on 160L, 28 mm EIAJ QFP package types: PQFP, PQFP with exposed heat slug, and Metal QFP. The performance of these package types is evaluated with reference to the design of each package
  • Keywords
    integrated circuit packaging; reliability; surface mount technology; 160L EIAJ QFP package; 28 mm; MQUAD packages; Metal QFPs; Plastic Quad Flat Packs; cost; design; electrical performance; exposed heat slugs; high leadcount IC packaging; internal heat spreaders; nonhermetic packages; reliability; surface-mount quad flat packages; thermal performance; thermally enhanced PQFPs; Aluminum; Automatic testing; Copper; Costs; Electronics packaging; Integrated circuit packaging; Lead; Performance evaluation; Plastic packaging; Reliability engineering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1994. Proceedings., 44th
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-7803-0914-6
  • Type

    conf

  • DOI
    10.1109/ECTC.1994.367590
  • Filename
    367590