DocumentCode
2377503
Title
Isolating and removing sources of variation in test data
Author
Turner, David ; Abercrombie, David ; McNames, James ; Daasch, Robert ; Madge, Robert
Author_Institution
Integrated Circuits Design & Test Lab., Portland State Univ., OR, USA
fYear
2002
fDate
2002
Firstpage
464
Lastpage
471
Abstract
We describe new methods of data analysis that identify and isolate sources of variation in production test data based on its natural taxonomy. We also describe an alternative approach to data analysis that integrates disparate data by removing each primary source of variation. This new approach has several advantages compared to traditional "divide and conquer" techniques (e.g. ANOVA). For example, the new approach enables us to identify secondary sources of variation that are normally obscured by the primary source. The methods are demonstrated on a die-speed measurement collected from seventy lots of two products produced at two fabrication facilities.
Keywords
data analysis; integrated circuit testing; production testing; statistical analysis; ANOVA; data analysis; data taxonomy; die-speed measurement; disparate data integration; divide-and-conquer techniques; fabrication facilities; primary variation source removal; product lots; production test; secondary variation sources; test data variation source isolation; Analysis of variance; Circuit synthesis; Circuit testing; Data analysis; Laboratories; Logic testing; Manufacturing processes; Production; Statistical analysis; Taxonomy;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2002. Proceedings. International
ISSN
1089-3539
Print_ISBN
0-7803-7542-4
Type
conf
DOI
10.1109/TEST.2002.1041796
Filename
1041796
Link To Document