Title :
Experimental evaluation of scan tests for bridges
Author :
Chakravarty, Sreejit ; Jain, Ankur ; Radhakrishnan, Nandakumar ; Savage, Eric W. ; Zachariah, Sujit T.
Abstract :
An impressive body of theoretical research to model the behavior of bridges exists. We take that a step further and describe an experiment to compute single cycle scan tests for bridges and evaluate them in silicon. Experimental data, on a high volume part, shows that by marginally increasing the static bridge fault coverage of realistic bridges, unique parts missed by a comprehensive set of stuck-at tests were detected. We believe that this is the first silicon data on the value of adding single cycle scan tests for bridges to the manufacturing flow.
Keywords :
automatic test pattern generation; boundary scan testing; fault location; integrated circuit reliability; integrated circuit testing; logic testing; production testing; Si; automatic test pattern generation; bridge fault experimental data; defect based scan tests; fault detection; scan test evaluation; single cycle bridge scan tests; static bridge fault coverage; structural testing techniques; stuck-at tests; Application specific integrated circuits; Automatic testing; Bridges; Cost function; Fault detection; Frequency; Manufacturing; Microprocessors; Silicon; Temperature distribution;
Conference_Titel :
Test Conference, 2002. Proceedings. International
Print_ISBN :
0-7803-7542-4
DOI :
10.1109/TEST.2002.1041801
