Title :
BIST-based diagnosis of FPGA interconnect
Author :
Stroud, Charles ; Nall, Jeremy ; Lashinsky, Matthew ; Abramovici, Miron
Author_Institution :
Dept. of Electr. & Comput. Eng., North Carolina Univ., Charlotte, NC, USA
Abstract :
We present a Built-In Self-Test (BIST)-based diagnostic approach for the programmable interconnect resources in Field Programmable Gate Arrays (FPGAs) that can be used for either on-line or off-line testing. The technique was originally intended for on-line diagnosis of faulty interconnect to support fault-tolerant applications. However, the technique has been proven to be an excellent approach for off-line testing and diagnosis as well, providing high-resolution diagnostics with the ability to identify the faulty wire segment or programmable switch. We have implemented this BIST-based diagnostic approach on the ORCA series FPGA and present the results of testing and diagnosing known defective FPGAs.
Keywords :
built-in self test; fault diagnosis; field programmable gate arrays; integrated circuit interconnections; integrated circuit testing; logic testing; BIST-based diagnosis; FPGA interconnect; ORCA series FPGA; built-in self-test; faulty programmable switch identification; faulty wire segment identification; field programmable gate arrays; high-resolution diagnostics; off-line testing; online testing; programmable interconnect resources; Built-in self-test; Circuit faults; Circuit testing; Fault diagnosis; Field programmable gate arrays; Integrated circuit interconnections; Routing; Switches; System testing; Wire;
Conference_Titel :
Test Conference, 2002. Proceedings. International
Print_ISBN :
0-7803-7542-4
DOI :
10.1109/TEST.2002.1041813
