Title :
The manic depression of microprocessor debug
Author :
Josephson, Don Douglas
Author_Institution :
Hewlett-Packard Co., Fort Collins, CO, USA
Abstract :
This paper describes the sometimes exhilarating, sometimes depressing, and always challenging job of leading-edge microprocessor debug. It covers an overview of processor debug, the flows, tools and methods used to perform debug, the process of "root causing" and fixing bugs, and includes case studies of actual bugs from recent processors. In conclusion, some of the future challenges for microprocessor testing are presented.
Keywords :
computer debugging; computer testing; failure analysis; integrated circuit testing; microprocessor chips; failure modes; microprocessor debugging; microprocessor testing; shmoo; Circuit testing; Computer bugs; Frequency; Job design; Low voltage; Manuals; Microprocessors; Needles; Silicon; System testing;
Conference_Titel :
Test Conference, 2002. Proceedings. International
Print_ISBN :
0-7803-7542-4
DOI :
10.1109/TEST.2002.1041817
