Title :
Silicon symptoms to solutions: applying design for debug techniques
Author :
Pyron, Carol ; Bangalore, Rekha ; Belete, Dawit ; Goertz, Jason ; Razdan, Ashutosh ; Younger, Denise
Author_Institution :
Motorola Inc., Austin, TX, USA
Abstract :
Quick and accurate silicon debug is essential for short time to market schedules. This paper describes several actual silicon debug test cases to illustrate both the range of issues found only after silicon is available as well as the range of design for debug features used in the diagnostic process. Each test case starts with the symptoms found on the silicon and follows through to the problem definition and resolution. The debug test cases cover issues from logic and circuit errors to process issues. The designs in the test cases include Motorola´s MPC7410 and MPC7450 advanced microprocessors and DSP56621 digital signal processor.
Keywords :
automatic test pattern generation; boundary scan testing; computer testing; design for testability; digital signal processing chips; failure analysis; integrated circuit design; integrated circuit testing; logic testing; microprocessor chips; DSP56621 digital signal processor; JTAG boundary scan diagnostic patterns; MPC7410; MPC7450; Motorola advanced microprocessors; circuit errors; design for debug techniques; diagnostic process; logic errors; process issues; silicon debug test cases; Chip scale packaging; Circuit testing; Failure analysis; Logic circuits; Logic testing; Pareto analysis; Signal design; Signal resolution; Silicon; System testing;
Conference_Titel :
Test Conference, 2002. Proceedings. International
Print_ISBN :
0-7803-7542-4
DOI :
10.1109/TEST.2002.1041818
