• DocumentCode
    2377924
  • Title

    Current and flux regulation in field-weakening operation [of induction motors]

  • Author

    Briz, F. ; Diez, A. ; Degner, M.W. ; Lorenz, R.D.

  • Author_Institution
    Dept. of Electr., Comput. & Syst. Eng., Oviedo Univ., Spain
  • Volume
    1
  • fYear
    1998
  • fDate
    12-15 Oct. 1998
  • Firstpage
    524
  • Abstract
    Induction motor field-weakening techniques have been developed which provide maximum torque capability above rated speed. Unfortunately most of these techniques are valid only for steady-state operation and show significant sensitivity to DC bus voltage and machine parameters. This paper analyzes the requirements of dynamically providing maximum torque under field-weakening operation. Three major issues are addressed: current regulator design; saturation techniques for current regulators in order to ensure best performance under voltage constraints; and flux regulator design to minimize transient errors when varying flux. Maximum DC bus utilization through the proper use of saturation techniques, dynamic response and reduced sensitivity are the advantages of the proposed solution.
  • Keywords
    control system analysis; control system synthesis; dynamic response; electric current control; induction motors; machine testing; machine theory; machine vector control; magnetic flux; magnetic variables control; control design; control performance; control simulation; current regulator design; current regulators; dynamic response; field-weakening operation; flux regulator design; induction motor vector control; maximum DC bus utilization; maximum torque capability; saturation techniques; sensitivity reduction; transient errors minimisation; voltage constraints; Computer errors; Current control; Influenza; Inverters; Regulators; Stators; Steady-state; Torque; Traction motors; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 1998. Thirty-Third IAS Annual Meeting. The 1998 IEEE
  • Conference_Location
    St. Louis, MO, USA
  • ISSN
    0197-2618
  • Print_ISBN
    0-7803-4943-1
  • Type

    conf

  • DOI
    10.1109/IAS.1998.732363
  • Filename
    732363